SHEN WEN-QI. The Proper Way of Capacitance and Tanδ Measurement of Power Capacitor. [J]. Power capacitor & reactive power compensation, 2006, (6): 38-43.
SHEN WEN-QI. The Proper Way of Capacitance and Tanδ Measurement of Power Capacitor. [J]. Power capacitor & reactive power compensation, 2006, (6): 38-43.DOI:
The Proper Way of Capacitance and Tanδ Measurement of Power Capacitor
The measurement principle for the capacitance and loss angle tangent of dielectric(Tanδ) of power capacitor used by a high-voltage SCHERING bridge and a high-voltage standard capacitor are introduced in detail.The way to extend range
to eliminate the measurement error
and to enhance the measuring accuracy is mentioned.The method to get the value of Tanδ by measuring the loss power of the full-film capacitor is briefly introduced as well.
关键词
电容介质损耗角正切(Tanδ)损耗功率高压西林电桥扩大量程测量误差
Keywords
capacitanceLoss angle tangent of dielectric(Tanδ)Loss powerHigh-voltage SCHERING bridgeExtending rangemeasurement error