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Optimization of Type Tests Circuit about Series Capacitor
更新时间:2024-09-14
    • Optimization of Type Tests Circuit about Series Capacitor

    • POWER CAPACITOR & REACTIVE POWER COMPENSATION   Issue 3, Pages: 15-17(2004)
    • CLC: TM53
    • Published:2004,

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  • ZUO QIANG-LIN, MAO CHENG-XIONG, LI WEI-BO. Optimization of Type Tests Circuit about Series Capacitor. [J]. Power capacitor & reactive power compensation, 2004, (3): 15-17. DOI:

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