您当前的位置:
首页 >
文章列表页 >
Internal Defect Finding in Current Transformer Using Infrared Temperature Diagnosis Technique
更新时间:2024-09-14
    • Internal Defect Finding in Current Transformer Using Infrared Temperature Diagnosis Technique

    • POWER CAPACITOR & REACTIVE POWER COMPENSATION   Issue 2, Pages: 32-33(2004)
    • CLC: TM452
    • Published:2004,

    移动端阅览

  • ZHANG JIAN-JUN, WANG HUI. Internal Defect Finding in Current Transformer Using Infrared Temperature Diagnosis Technique. [J]. Power capacitor & reactive power compensation, 2004, (2): 32-33. DOI:

  •  
  •  

0

Views

119

下载量

11

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Analysis of the Crack Reason of Neutral Point Current Transformer in Complete Power Capacitor Bank

Related Author

CAI Yun-feng

Related Institution

Suzhou Power Supply Company
0