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Simulation Analysis and Suggestions on Influence of T-type Network on Dielectric Loss Testing
Capacitor | 更新时间:2024-12-27
    • Simulation Analysis and Suggestions on Influence of T-type Network on Dielectric Loss Testing

    • Power Capacitor & Reactive Power Compensation   Vol. 45, Issue 6, Pages: 30-35(2024)
    • DOI:10.14044/j.1674-1757.pcrpc.2024.06.005    

      CLC:
    • Published:2024-12,

      Received:18 February 2024,

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  • LI YONGKUN, ZHAO SHENGNAN, CHANG LIMIN, et al. Simulation Analysis and Suggestions on Influence of T-type Network on Dielectric Loss Testing. [J]. Power capacitor & reactive power compensation, 2024, 45(6): 30-35. DOI: 10.14044/j.1674-1757.pcrpc.2024.06.005.

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