Defect Analysis and Protection of DC Support Capacitors for VSC-HVDC Projects
- 柔直工程用直流支撑电容器缺陷分析与防护
- Vol. 46, Issue 6, Pages: 41-48(2025)
DOI:10.14044/j.1674-1757.pcrpc.2025.06.006
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State Key Laboratory of High Density Electrical Energy Conversion(Huazhong University of Science and Technology),Wuhan 430074,China
Key Laboratory of Pulsed Power Technology(Huazhong University of Science and Technology),Wuhan 430074,China
Electric Power Research Institute of Guangdong Power Grid Co.,Ltd.,Guangzhou 510080,China
Key Laboratory of Electric Power Equipment Reliability Enterprises,Guangzhou 510080,China
Received:07 July 2025,
Published:25 December 2025
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LIAO Zihao, WANG Geng, LI Hua, et al. Defect Analysis and Protection of DC Support Capacitors for VSC-HVDC Projects[J]. Power Capacitor & Reactive Power Compensation, 2025, 46(6): 41-48.
LIAO Zihao, WANG Geng, LI Hua, et al. Defect Analysis and Protection of DC Support Capacitors for VSC-HVDC Projects[J]. Power Capacitor & Reactive Power Compensation, 2025, 46(6): 41-48. DOI: 10.14044/j.1674-1757.pcrpc.2025.06.006.
柔性直流输电系统中,金属化膜电容器作为核心储能元件,其可靠性直接影响电网安全运行。针对工程中因制造缺陷引发的失效问题,本文系统研究了卷绕、喷金、浇注及杂质入侵4类典型缺陷的失效机理。通过极间耐压、冲击放电、交直流加速老化等多维度试验测试,结合电容量退化规律与介质损耗特性分析,揭示了缺陷在不同应力条件下的失效规律,采用电容敏感因子量化不同测试下的缺陷灵敏度。结果表明,极间耐压对喷金缺陷最敏感、冲击放电对卷绕缺陷最敏感、直流电压加速老化对浇注缺陷最敏感、直流叠加工频交流对浇注缺陷最敏感、直流耐久对卷绕缺陷最敏感。基于缺陷机制,提出缺陷防护策略,为提升电容器可靠性提供了理论与技术支撑。
In the VSC-HVDC transmission system,metallized film capacitors serve as core energy storage components,and their reliability directly affects safe operation of the power grid. As for the the failure issues due to manufacturing defects in projects,in this paper the failure mechanisms of such four typical defects as winding,metallization,casting and impurity intrusion are systematically studied. Through such multidimensional tests as inter-electrode voltage withstand,impulse discharge,and accelerated aging under AC and DC conditions and also in combination with capacitance degradation as well as dielectric loss characteristic analysis,the failure of defects under different stress conditions are revealed. The capacitance sensitivity factor is used to quantify the defect sensitivity of different tests. The results show that inter-electrode voltage withstand is most sensitive to metallization defects,the impulse discharge is most sensitive to the winding defects,the DC voltage accelerated aging is most sensitive to casting defects,the DC superimposed power frequency AC is most sensitive to casting defects,and the DC durability is most sensitive to the winding defects. The defect protection strategies are proposed based on the defect mechanism,providing theoretical and technical support for enhancing capacitor reliability.
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