Influence and Characterization of Key Process Defects on Performance of VSC-HVDC Capacitors

LIAO Zihao; CAI Linglong; MA Zhiqin; LI Qian; WANG Zhongao; ZHOU Dan; LI Zhongxiang

doi:10.14044/j.1674-1757.pcrpc.2025.06.007

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Influence and Characterization of Key Process Defects on Performance of VSC-HVDC Capacitors

POWER CAPACITOR & REACTIVE POWER COMPENSATION | Capacitor

Influence and Characterization of Key Process Defects on Performance of VSC-HVDC Capacitors
柔直电容器关键工艺缺陷对性能的影响及表征
Electric Power Research Institute of Guangdong Power Grid Co.，Ltd.，Guangzhou 510080，China
Key Laboratory of Electric Power Equipment Reliability Enterprises，Guangzhou 510080，China
Vol. 46, Issue 6, Pages: 49-57(2025)
DOI：10.14044/j.1674-1757.pcrpc.2025.06.007
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LIAO Zihao, CAI Linglong, MA Zhiqin, et al. Influence and Characterization of Key Process Defects on Performance of VSC-HVDC Capacitors[J]. Power Capacitor & Reactive Power Compensation, 2025, 46(6): 49-57.
DOI：

LIAO Zihao, CAI Linglong, MA Zhiqin, et al. Influence and Characterization of Key Process Defects on Performance of VSC-HVDC Capacitors[J]. Power Capacitor & Reactive Power Compensation, 2025, 46(6): 49-57. DOI： 10.14044/j.1674-1757.pcrpc.2025.06.007.

摘要

本文针对柔直电容器整机生产过程中的关键工艺缺陷，系统研究了焊接、浇注等工艺环节可能引入的缺陷类型及其对样机性能的影响，明确不同缺陷对应的特征参量。通过人为设置虚焊、尖角焊接、非真空浇注、壳体分离等典型缺陷，设计和制作了缺陷元件及试品，并提出了相应的工艺质量管控措施。基于电容量、损耗角正切、局部放电量等特征参量，结合极对壳耐压、局部放电、极间耐压及直流老化等试验方法，分析了不同缺陷对电容器性能的影响规律。研究结果表明，虚焊缺陷显著增加局部放电量，非真空浇注缺陷在交直流叠加老化试验中易引发自愈失效，而未注胶缺陷则加速电容器的劣化进程。本文提出的缺陷表征参数和试验方法为柔直电容器的工艺优化和质量提升提供了理论依据和试验方法支持。

Abstract

Aiming at the key process defects in the production process of VSC-HVDC capacitors，in this paper the types of defects due to soldering and casting and their impact on the performance of the prototype are systematically studied，and the characteristic parameters corresponding to different defects are clarified. By artificially setting such typical defects as cold solder joints，sharp angle soldering，non-vacuum casting and case separation，defective components and test samples are designed and produced，and corresponding process quality control measures are proposed. Based on such characteristic parameters as capacitance，loss tangent，partial discharge and also in combination with such test methods as withstand voltage of pole to case，partial discharge，inter-pole withstand voltage，and DC aging，the influence of different defects on the performance of capacitors is analyzed. The research results show that the cold solder joints defects significantly increase the partial discharge，the non-vacuum casting defects are prone to cause self-healing failure in AC/DC superimposed aging tests，while the non-injection defects accelerate the degradation process of capacitors. The defect characterization parameters and test methods proposed in this paper provide theoretical basis and test method support for process optimization and quality improvement of VSC-HVDC capacitors.

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