Influence of Ambient Temperature and Applied Voltage on the Temperature Rise and Temperature Distribution of Self-healing Power Capacitor

LEI Xiaoyan; CAO Gang; XIAO Liangle; CHEN Shujiao; LU Hongji

doi:10.14044/j.1674-1757.pcrpc.2026.01.007

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Influence of Ambient Temperature and Applied Voltage on the Temperature Rise and Temperature Distribution of Self-healing Power Capacitor

POWER CAPACITOR & REACTIVE POWER COMPENSATION | Capacitor

Influence of Ambient Temperature and Applied Voltage on the Temperature Rise and Temperature Distribution of Self-healing Power Capacitor
直流支撑电容器电容介损测量方法研究
China Electric Power Research Institute Co., Ltd., Wuhan 430074, China
Vol. 47, Issue 1, Pages: 50-56(2026)
DOI：10.14044/j.1674-1757.pcrpc.2026.01.007
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LEI Xiaoyan, CAO Gang, XIAO Liangle, et al. Influence of Ambient Temperature and Applied Voltage on the Temperature Rise and Temperature Distribution of Self-healing Power Capacitor[J]. Power Capacitor & Reactive Power Compensation, 2026, 47(1): 50-56.
DOI：

LEI Xiaoyan, CAO Gang, XIAO Liangle, et al. Influence of Ambient Temperature and Applied Voltage on the Temperature Rise and Temperature Distribution of Self-healing Power Capacitor[J]. Power Capacitor & Reactive Power Compensation, 2026, 47(1): 50-56. DOI： 10.14044/j.1674-1757.pcrpc.2026.01.007.

摘要

柔性直流换流阀用直流支撑电容器一般为多端子结构，运行过程中电流较大，现阶段参考传统双端子结构高压电力电容器的测量接线方式进行电容介损测量。柔性直流支撑电容器的电容量和损耗角正切值的准确评估，直接影响着运行性能、安全可靠性评估等方面。本文就现有电容介损测量中的一些问题进行分析，提出更合理的测量建议。认为在开展大容量多端子电容器的电容介损时，应采用多股铜线接线方式，该结论对指导准确测量多端子电容器的电容介质损耗具有重要意义。

Abstract

DC-link capacitors for VSC-HVDC converter valve is of generally multi-terminal structure，and has high current in operation. Currently，capacitance and tan

measurements for the capacitors are often performed by referring to the measurement connection methods used for traditional high-voltage power capacitors with two terminal structure. The accurate assessment of the capacitance and tangent of the loss angle（tanδ）ofVSC-HVDC-link capacitors directly impacts such aspects as operational performance and safety reliability assessment. In this paper some issues in existing capacitance and tan

measurement methods are analyzed and more rational measurement recommendations are proposed.It is thought that in the development the capacitance and tanδ of high power multiple terminal capacitor，the multi strand copper wi

re mode shall be adopted .The conclusion plays an important role in guiding ccurate measurement of capacitance and tan

of multi-terminal capacitors.

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references

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