YANG WEN-RONG. Discussion on the Validity of Qualified Type Test or Endurance Test of Shunt Capacitor. [J]. Power capacitor & reactive power compensation, 2010, 31(4): 53-55.
YANG WEN-RONG. Discussion on the Validity of Qualified Type Test or Endurance Test of Shunt Capacitor. [J]. Power capacitor & reactive power compensation, 2010, 31(4): 53-55. DOI: 10.14044/j.1674-1757.pcrpc.2010.04.011.
Discussion on the Validity of Qualified Type Test or Endurance Test of Shunt Capacitor
摘要
并联电容器设计参数的改变是否需要重新对产品进行型式试验或耐久性试验
一般认为应重新试验
但不是绝对的
文章以2膜产品改变为3膜产品为例
从标准规定和试验结果分析方面论证
得出设计参数仅从2膜改为3膜在总厚不变条件下不需再进行型式试验或耐久性试验
具体情况
具体对待。
Abstract
This paper discusses the issue on shunt capacitor’s type test or the endurance test should be repeated or not
in case of some design parameters changed.The common idea is that the test must be repeated
but it is not absolute.Taking the change of 2 film product into 3 film product as an example and verifying from the standard specification and analysis of test result
it is concluded that in case the film layer is changed only from 2 to 3 but total film thickness remains unchanged
namely
in case of slight change of certain ratings
it is not needed to perform type test or endurance test any longer.