您当前的位置:
首页 >
文章列表页 >
Analysis of Bursting Test of the High Voltage Internal Fuse All-film Shunt Capacitors
更新时间:2024-09-14
    • Analysis of Bursting Test of the High Voltage Internal Fuse All-film Shunt Capacitors

    • POWER CAPACITOR & REACTIVE POWER COMPENSATION   Vol. 32, Issue 4, Pages: 42-47(2011)
    • DOI:10.14044/j.1674-1757.pcrpc.2011.04.010    

      CLC: TM531.4
    • Published:2011,

    移动端阅览

  • MU SHU-YUN, DONG YAN, CHEN WEN-LIANG. Analysis of Bursting Test of the High Voltage Internal Fuse All-film Shunt Capacitors. [J]. Power capacitor & reactive power compensation, 2011, 32(4): 42-47. DOI: 10.14044/j.1674-1757.pcrpc.2011.04.010.

  •  
  •  

0

Views

121

下载量

6

CSCD

Alert me when the article has been cited
提交
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

No data

Related Author

No data

Related Institution

No data
0