YANG YANG, XU QIANG, CHEN AN-MING, et al. High Voltage Dielectric Loss Diagnosis and Analysis of Shunt Capacitors between Breaks of 500 kV Circuit Breaker. [J]. Power capacitor & reactive power compensation, 2011, 32(5): 64-67.
YANG YANG, XU QIANG, CHEN AN-MING, et al. High Voltage Dielectric Loss Diagnosis and Analysis of Shunt Capacitors between Breaks of 500 kV Circuit Breaker. [J]. Power capacitor & reactive power compensation, 2011, 32(5): 64-67. DOI: 10.14044/j.1674-1757.pcrpc.2011.05.014.
High Voltage Dielectric Loss Diagnosis and Analysis of Shunt Capacitors between Breaks of 500 kV Circuit Breaker
through analyzing high voltage dielectric loss test result of shunt capacitors between breaks of certain 500 kV circuit breaker
the results show that the measured dielectric loss value exceeded the standard under 10 kV voltage during the routine test
this is due to the interference of Garton effect keeps the measured value much higher than the dielectric loss under actual operating voltage.The interference of Garton effect can be effectively avoided through high voltage dielectric test
the measured result of actual operating condition can be more reflected
and thus correct criteria evidence for condition diagnosis is provided.
关键词
开关断口间并联电容器介损Garton效应状态诊断
Keywords
shunt capacitor between open contacts of circuit breakerdielectric lossGarton effectcondition diagnosis