WANG ZHEN-DONG1, CHEN CUI-HUA2. Discussion on Effective Control of Dielectric Loss Angle Tangent(tanδ) of Metalized Capacitor. [J]. Power capacitor & reactive power compensation, 2012, 33(3): 61-64.
WANG ZHEN-DONG1, CHEN CUI-HUA2. Discussion on Effective Control of Dielectric Loss Angle Tangent(tanδ) of Metalized Capacitor. [J]. Power capacitor & reactive power compensation, 2012, 33(3): 61-64. DOI: 10.14044/j.1674-1757.pcrpc.2012.03.012.
Discussion on Effective Control of Dielectric Loss Angle Tangent(tanδ) of Metalized Capacitor
摘要
降低和控制损耗角正切tanδ是决定CBB21型金属化电容器性能是否优异的关键
根据卷绕、热聚合、喷金、焊接、浸渍、测试等工序对损耗影响关系分析
通过工艺参数的优化比较
提出选择合理工艺参数
尤其是喷金、焊接工艺参数
能够有效控制和降低电容器的损耗角正切tanδ。
Abstract
Reducing and controlling loss angle tangent(tanδ) is the key to decide performance of CBB21 type metal capacitor.According to the analysis of influence of winding
hot polymerization
spraying
welding
dipping
test process on the dielectric loss and through optimization comparison of processing ratings
it is proposed that selecting reasonable processing parameters
especially metal spraying
welding process parameters
can effectively control and reduce loss angle tangent(tanδ) of capacitor.
关键词
损耗角正切喷金工艺焊接工艺接触电阻
Keywords
loss angle tangent(tanδ)metal spraying processwelding processcontact resistance