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Analysis on Larger Dielectric Loss Caused by Poor Contact in Measuring Circuit
更新时间:2024-09-14
    • Analysis on Larger Dielectric Loss Caused by Poor Contact in Measuring Circuit

    • POWER CAPACITOR & REACTIVE POWER COMPENSATION   Vol. 35, Issue 2, Pages: 78-81(2014)
    • DOI:10.14044/j.1674-1757.pcrpc.2014.02.015    

      CLC: TM216.5
    • Published:2014,

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  • CHENG YANGJUN, HUANG KUN, ZHUANG WEI. Analysis on Larger Dielectric Loss Caused by Poor Contact in Measuring Circuit. [J]. Power capacitor & reactive power compensation, 2014, 35(2): 78-81. DOI: 10.14044/j.1674-1757.pcrpc.2014.02.015.

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