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Study on Poor Contact Test of Capacitive Circuit at Micro-gap
更新时间:2024-09-14
    • Study on Poor Contact Test of Capacitive Circuit at Micro-gap

    • POWER CAPACITOR & REACTIVE POWER COMPENSATION   Vol. 38, Issue 1, Pages: 76-79(2017)
    • DOI:10.14044/j.1674-1757.pcrpc.2017.01.014    

      CLC: TM53;TM75
    • Published:2017,

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  • YANG YI, LIU QIANG, ZHANG QI, et al. Study on Poor Contact Test of Capacitive Circuit at Micro-gap. [J]. Power capacitor & reactive power compensation, 2017, 38(1): 76-79. DOI: 10.14044/j.1674-1757.pcrpc.2017.01.014.

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