YANG YI, LIU QIANG, ZHANG QI, et al. Study on Poor Contact Test of Capacitive Circuit at Micro-gap. [J]. Power capacitor & reactive power compensation, 2017, 38(1): 76-79.
YANG YI, LIU QIANG, ZHANG QI, et al. Study on Poor Contact Test of Capacitive Circuit at Micro-gap. [J]. Power capacitor & reactive power compensation, 2017, 38(1): 76-79. DOI: 10.14044/j.1674-1757.pcrpc.2017.01.014.
Study on Poor Contact Test of Capacitive Circuit at Micro-gap
For the overheat issue due to poor contact of connection parts of capacitor
the poor contact test of capacitive circuit on the 220 V system is performed systematically. The test and study are performed from the aspects of contact resistance and partial discharge by way of simulating poor contact condition of capacitor connection parts under micro-gap by needle-plate model. The study result shown that the contact resistance changes during the complete poor contact period
but
as a whole
it increase exponentially with the increase of gap and is influenced greatly by contact type. In the range of test load
the phase feature of poor contact and partial discharge remains basically unchanged
the discharge feature variation at fixed intensive discharge region and the influence by contact type and load magnitude is also big.