The noise of the capacitor is closely related to the structure and load condition of the unit. The capacitor noise is changed accordingly with either variation of the unit structure and load condition. At present

the full capacity loading for the noise measurement of the capacitor is adopted

namely

the current component of the capacitor in operation is completely simulated. Since the capacity of the capacitor is generally big

the requirement of the full load nose test to the equipment capacity is very high. At present

the single frequency scanning frequency method for the capacitor is also studied and a definite result is obtained

but the amount of such test very big. In this paper

the multi-frequency scanning frequency measurement method for the capacitor is described

the multi-frequency equivalent voltage calculation and multiple synthesis methods are described which obtains multiple frequency features in one measurement and reduces greatly the scanning frequency test work. The multiple frequency scanning test is performed on the sample and the frequency feature of the capacitor sample is obtained through four times tests. The difference between the full capacity loading method and scanning frequency method is compared on the basis of frequency feature.