Analysis and Processing on Two Overheat Defects of Capacitor Voltage Transformer Electromagnetic Unit

ZHANG Xingfei

doi:10.14044/j.1674-1757.pcrpc.2018.02.009

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Analysis and Processing on Two Overheat Defects of Capacitor Voltage Transformer Electromagnetic Unit

更新时间：2024-09-14

- Analysis and Processing on Two Overheat Defects of Capacitor Voltage Transformer Electromagnetic Unit
- POWER CAPACITOR & REACTIVE POWER COMPENSATION Vol. 39, Issue 2, Pages: 44-48(2018)
- 作者机构：
  
  国网河北省电力有限公司检修分公司
- 作者简介：
- 基金信息：
- DOI：10.14044/j.1674-1757.pcrpc.2018.02.009
  CLC： TM451.2
- Published：2018，
- 稿件说明：
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[1]张兴飞.两起CVT电磁单元过热缺陷的分析和处理[J].电力电容器与无功补偿,2018,39(02):44-48.

ZHANG XINGFEI. Analysis and Processing on Two Overheat Defects of Capacitor Voltage Transformer Electromagnetic Unit. [J]. Power capacitor & reactive power compensation, 2018, 39(2): 44-48.
[1]张兴飞.两起CVT电磁单元过热缺陷的分析和处理[J].电力电容器与无功补偿,2018,39(02):44-48. DOI： 10.14044/j.1674-1757.pcrpc.2018.02.009.

ZHANG XINGFEI. Analysis and Processing on Two Overheat Defects of Capacitor Voltage Transformer Electromagnetic Unit. [J]. Power capacitor & reactive power compensation, 2018, 39(2): 44-48. DOI： 10.14044/j.1674-1757.pcrpc.2018.02.009.

摘要

本文介绍了两起电容式电压互感器（CVT）电磁单元通过红外测温发现电磁单元过热的缺陷

通过监控电压分析

内部结构和设备解体

判断发热原因

并验证了分析的正确性

同时提出了包括加强运行监测、红外测温、设备验收等缺陷管控措施

有效地保证设备安全稳定运行。

Abstract

In this paper

the overheat defect of capacitor voltage transformer（CVT） electromagnetic unit is found by the infrared temperature measurement. The reason cause of the heat is judged by way of monitoring voltage analysis

disassembly of internal structure and of the equipment

the correctness of the analysis is verified

at the same time

the control measures for such defects is strengthened by way of operation monitoring

infrared temperature measurement and equipment acceptance so to assure safe and stable operation of the equipment.

关键词

电容式电压互感器（CVT）红外测温电磁单元发热缺陷

Keywords

capacitor voltage transformer（CVT）infrared temperature measurementelectromagnetic unitoverheat defect

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