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Study Development on the Reliability of Metallized Film Capacitor
更新时间:2024-09-14
    • Study Development on the Reliability of Metallized Film Capacitor

    • POWER CAPACITOR & REACTIVE POWER COMPENSATION   Vol. 40, Issue 1, Pages: 53-58(2019)
    • DOI:10.14044/j.1674-1757.pcrpc.2019.01.011    

      CLC: TM53
    • Published:2019,

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  • LIU YONGBIN, CAO JUNZHENG, HUANG JINKUI, et al. Study Development on the Reliability of Metallized Film Capacitor. [J]. Power capacitor & reactive power compensation, 2019, 40(1): 53-58. DOI: 10.14044/j.1674-1757.pcrpc.2019.01.011.

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