GAI BIN, CAI JUN, ZHAO LIANG, et al. Simulation Analysis and Test Study on Switching of Shunt Capacitor Device. [J]. Power capacitor & reactive power compensation, 2020, 41(6): 1-7.
GAI BIN, CAI JUN, ZHAO LIANG, et al. Simulation Analysis and Test Study on Switching of Shunt Capacitor Device. [J]. Power capacitor & reactive power compensation, 2020, 41(6): 1-7. DOI: 10.14044/j.1674-1757.pcrpc.2020.06.001.
Simulation Analysis and Test Study on Switching of Shunt Capacitor Device
摘要
并联电容器装置投切试验是检测其质量的一项重要试验
该项试验综合考量了并联电容器装置的整体性能。但受限于试验条件
目前无法有效地在实验室中进行。为此提出两种实验室条件下的试验方案
通过仿真验证了两种试验回路的一致性
结合试验验证
分析了并联电容器装置在投切过程中出现的冲击电流、涌流和残余电压
可为实验室实施投切试验提供参考。
Abstract
The switching test of shunt capacitoris an important test to check quality of the capacitor and the test considers comprehensively the overall performance of the device.However
it cannot be tested in the laboratory at present due to the limit of test condition.Therefore
two kinds of test schemes under laboratory conditions are proposed in this paper
the consistency of the two test circuits is verified and
with combination of test verification
the impulse current
inrush currentand residual voltage occurringduring the switching of shunt capacitor are analyzed so to provide reference for implementing the switching test in the laboratory.