YANG DAIYONG, YU FEIHONG, JIAO LIXIN, et al. Study on Fault Development Characteristics of Shunt Compensation Capacitor Bank in 66 kV Substation. [J]. Power capacitor & reactive power compensation, 2021, 42(2): 5-11.
YANG DAIYONG, YU FEIHONG, JIAO LIXIN, et al. Study on Fault Development Characteristics of Shunt Compensation Capacitor Bank in 66 kV Substation. [J]. Power capacitor & reactive power compensation, 2021, 42(2): 5-11. DOI: 10.14044/j.1674-1757.pcrpc.2021.02.002.
Study on Fault Development Characteristics of Shunt Compensation Capacitor Bank in 66 kV Substation
During the operation of the shunt capacitor bank in a substation
various faults may occur inside the capacitor due to the influence of such factors as dielectric insulation aging
the overvoltage with large amplitude may generate and threaten insulation of the shunt capacitor bank. ATP-EMTP is used to simulate the voltage and current variation characteristics of the shunt capacitor bank in the 66 kV substation at such four fault conditions as capacitor component breakdown and arcing
reliable fusing of faulty components
capacitor multi-explosion
capacitor multi-explosion and reignition. It is shown by the study result in case of the first two faults
the node voltage of the shunt capacitor bank is basically unchanged and the current flowing on the healthy capacitor element has a slight increase. While
in case of the latter two faults
the remarkable over voltage and over current will occur on the node of capacitor bank
which threatens the insulation of capacitor bank and shall be protected.