SUN LIPENG, LIU YUN, LI GANG, et al. Analysis of Cause of High Dielectric Loss Under 10 kV Stress of Grading Capacitor Across Open Contacts of Circuit Breaker. [J]. Power capacitor & reactive power compensation, 2021, 42(4): 165-169.
DOI:
SUN LIPENG, LIU YUN, LI GANG, et al. Analysis of Cause of High Dielectric Loss Under 10 kV Stress of Grading Capacitor Across Open Contacts of Circuit Breaker. [J]. Power capacitor & reactive power compensation, 2021, 42(4): 165-169. DOI: 10.14044/j.1674-1757.pcrpc.2021.04.023.
Analysis of Cause of High Dielectric Loss Under 10 kV Stress of Grading Capacitor Across Open Contacts of Circuit Breaker
摘要
本文针对国内某工程交接试验中大量10 kV下介损超标的断路器断口均压电容器
开展了高压介损、局部放电、密封性试验、油色谱分析等试验
发现电容量与试验电压、介损值的减小值和电容量的减小值、金属颗粒含量与10 k V下介损值有一定的关系
对其原因进行了综合分析
可为后续的相关研究提供参考。
Abstract
In view of grading capacitor with a large number of excessive 10 kV dielectric loss in a certain handover test in China in this paper
the test such as high-voltage dielectric loss
partial discharge
tightness and oil chromatogram analysis are performed.If is found that capacitance and the test voltage
reduction of dielectric loss and capacitance
contents of metal particle have a definite relationship with10 k V dielectric loss value.The causes are comprehensively analyzed
which can provide reference for the subsequent related study.