SHEN WEN-QI. Estimation on the Expected Operation Life of High-voltage Shunt Capacitor. [J]. Power capacitor & reactive power compensation, 2005, (3): 25-26.
SHEN WEN-QI. Estimation on the Expected Operation Life of High-voltage Shunt Capacitor. [J]. Power capacitor & reactive power compensation, 2005, (3): 25-26.DOI：
Electric-field intensity acting on dielectric and the operation temperature of dielectric are the main factors stressing on the power capac itors. According to the conditions of ageing test within endurance test
the expected operation life of a high-voltage shunt capacitor which operates under the standard condition is estimated.
关键词
预期使用寿命电场强度介质温度
Keywords
Expected operation lifeElectric-field intensityTemperature of dielectric
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