ZHANG AI-LI. Condition Verification on Destruction test of Self-healingLow-voltage Shunt Capacitor. [J]. Power capacitor & reactive power compensation, 2004, (4): 34-36.
ZHANG AI-LI. Condition Verification on Destruction test of Self-healingLow-voltage Shunt Capacitor. [J]. Power capacitor & reactive power compensation, 2004, (4): 34-36.DOI: