NING FENG HUI. Brief Discussion on the Dielectric Loss of Circuit-breaker Capacitor. [J]. Power capacitor & reactive power compensation, 2002, (4): 20-22.
NING FENG HUI. Brief Discussion on the Dielectric Loss of Circuit-breaker Capacitor. [J]. Power capacitor & reactive power compensation, 2002, (4): 20-22.DOI：
浅谈断路器电容器介质损耗问题
摘要
通过对断路器电容器特点及其损耗产生的分析
解释了断路器电容器常见的低场强下损耗角正切 tanδ易于偏大以及随着时间的增加 tanδ增长的现象
并提出解决措施
Abstract
The analysis of the dielectric loss and characteristics of circuit breaker capacitor explains the reasons why the tangent of the loss angle （tanδ） tends to be big at low voltage
and why it increases with the voltage application time. Finally
the solutions are suggested.
关键词
断路器电容器损耗角正切tanδ杂质离子损耗
Keywords
Circuit breaker Capacitor （Grading Capacitor）Tangent of the loss angle （tanδ）Impurity\ Ionic Loss
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