SHEN WEN-QI, GUO TIAN-XING, YANG JING-NAN, et al. Overvoltage Caused by Trpping of Internal Fuse in High-voltage Capacitor. [J]. Power capacitor & reactive power compensation, 2002, (2): 1-3.
SHEN WEN-QI, GUO TIAN-XING, YANG JING-NAN, et al. Overvoltage Caused by Trpping of Internal Fuse in High-voltage Capacitor. [J]. Power capacitor & reactive power compensation, 2002, (2): 1-3.DOI:
高压电容器内熔丝动作引起的过电压及其对策
摘要
对内熔丝电容器中
因内熔线动作引起的作用在完好元件上的过电压进行了定性、定量分析。进行了试验验证。提出了解决办法。
Abstract
The overvoltage on sound elements caused by internal fuse tripping in the high-voltage power capacitor is analyzed both qualitatively and quantitatively. Based on previous successful experiences
preventive measures are proposed.
关键词
内熔丝内熔丝电容器元件直流分量过电压放电电阻
Keywords
internal fusecapacitor with internal fuseelementsD.C.componentovervoltageDischarge resistance