SHEN WEN QI, GUO TIAN XING, YANG JING NAN, et al. Overvoltage Caused by Trpping of Internal Fuse in High-voltage Capacitor. [J]. Power capacitor & reactive power compensation, 2002, (3): 5-8.
SHEN WEN QI, GUO TIAN XING, YANG JING NAN, et al. Overvoltage Caused by Trpping of Internal Fuse in High-voltage Capacitor. [J]. Power capacitor & reactive power compensation, 2002, (3): 5-8.DOI:
高压电容器内熔丝动作引起的过电压及其对策(续)
摘要
对内熔丝电容器中
因内熔线动作引起的作用在完好元件上的过电压进行了定性、定量分析。进行了试验验证。提出了解决办法。
Abstract
The overvoltage on sound elements caused by internal fuse tripping in the high voltage power capacitor is analyzed both qualitatively and quantitatively. Based on previous successful experiences
preventive measures are proposed.
关键词
内熔丝内熔丝电容器元件直流分量过电压放电电阻
Keywords
internal fusecapacitor with internal fuseelementsD.C. componentovervoltageDischarge resistance