MU SHU-YUN, DONG YAN, CHEN WEN-LIANG. Analysis of Bursting Test of the High Voltage Internal Fuse All-film Shunt Capacitors. [J]. Power capacitor & reactive power compensation, 2011, 32(4): 42-47.
MU SHU-YUN, DONG YAN, CHEN WEN-LIANG. Analysis of Bursting Test of the High Voltage Internal Fuse All-film Shunt Capacitors. [J]. Power capacitor & reactive power compensation, 2011, 32(4): 42-47. DOI: 10.14044/j.1674-1757.pcrpc.2011.04.010.
Bursting test process and mechanism of the high voltage all-film shunt capacitors are analyzed.It is pointed out in this paper
through particular behavior of the internal fuse capacitors with combination of achievement of the oil switch bursting research
that the direct reason of capacitor bursting failure is due to the pressure wave produced by the arc in capacitor oil
and the amplitude of the bow wave of the pressure is determined by the energy injection rate dW/dt.Therefore
direct reason for the bursting of capacitor is not due to injected energy but energy rising rate dW/dt.The behavior of the internal fuse in capacitor bursting test is also especially analyzed.It is shown in the test that a great deal of energy is injected during the bursting test of some internal fuse all-film capacitors
but the capacitor case is still in good condition without any damage.This is not only related to the dielectric system construction
but also to the fuse’s action behavior.Finally
the measures of improving the ability of capacitor to resist the bursting are discussed.
关键词
内熔丝全膜并联电容器壳体爆裂试验顶头压力波能量上升速率注入能量
Keywords
internal fuse all-film capacitorsbursting testbow wave of the pressureenergy rising rateinjected energy