Metalized film pulsed capacitors are widely used in pulsed power system. In case of short time film breakdown in the capacitor

insulation of the capacitor can be recovered due to its self-healing feature

thus makes the stability of capacitor is improved. However

due to the ongoing healing

the capacitance is in continuous reduction. Capacitance reduction at 5% of metalized film pulsed capacitor is defined as the mark of life end. In this paper

the factors affecting life of metalized film pulsed capacitors are analyzed

the life test method of metalized film pulsed capacitor is proposed in accordance with different affecting factors

and the principle of such test method and main equipment are introduced. This method can effectively test the life characteristics of metalized film pulsed capacitor

which has certain guiding significance

to capture life characteristics of the capacitor and to form life prediction based on the life test.