CHENG YANGJUN, HUANG KUN, ZHUANG WEI. Analysis on Larger Dielectric Loss Caused by Poor Contact in Measuring Circuit. [J]. Power capacitor & reactive power compensation, 2014, 35(2): 78-81.
CHENG YANGJUN, HUANG KUN, ZHUANG WEI. Analysis on Larger Dielectric Loss Caused by Poor Contact in Measuring Circuit. [J]. Power capacitor & reactive power compensation, 2014, 35(2): 78-81. DOI: 10.14044/j.1674-1757.pcrpc.2014.02.015.
由测量回路接触不良引起介损偏大的分析
摘要
本文重点阐述测量回路接触不良对套管介损测量的影响。实例中介绍了变压器套管内部结构
并画出其等效电路图
在排除多种影响套管介损测量的因素后
通过对变压器套管中等电位销锈蚀引起的附加电阻加以向量分析
找出套管介损超标的真正原因
对比套管检修前后的试验数据阐明了测试回路的接触情况对于准确测量套管介损的重要性
最后
对变压器套管检修提出了几点建议。
Abstract
In this paper
the influence of poor contact of measurement circuit on dielectric loss is mainly described. Internal structure of transformer bushing is introduced by example and its equivalent electrical diagram is drawn. After eliminating various factors affecting dielectric loss measurement of bushing
through vector analysis of the additional resistance caused by the rusting of potential pin in the transformer bushing
the real reason for dielectric loss exceeding is found. Through comparing the test data before and after the course of bushing’s maintenance
the importance of test circuit contact for accurate measurement of dielectric loss is presented
and finally
some suggestions on maintenance of transformer bushing are made.
关键词
接触不良套管介损测量附加电阻
Keywords
poor contactbushing of transformermeasurement of dielectric lossadditional resistance