QIU TAIHONG, WANG JUNBO, LI GUOWEI, et al. Analysis on Capacitor Bank Fault Trip Based on EMTP/ATP. [J]. Power capacitor & reactive power compensation, 2017, 38(5): 17-21.
QIU TAIHONG, WANG JUNBO, LI GUOWEI, et al. Analysis on Capacitor Bank Fault Trip Based on EMTP/ATP. [J]. Power capacitor & reactive power compensation, 2017, 38(5): 17-21. DOI: 10.14044/j.1674-1757.pcrpc.2017.05.004.
基于EMTP/ATP电容器组故障跳闸原因分析
摘要
通过对某110 k V变电站21C电容器组故障跳闸的检查试验、故障录波分析以及EMTP/ATP仿真计算
The fault reason of capacitor is found through the inspection and test of the tripping
fault recordwave analysis and EMTP/ATP simulation calculation of 21 C capacitor bank of certain a 110 k V substationas follows:The first reason is that B5 capacitor has the defect of weak insulation before closing operation and
in case of closing operation
the insulation breakdown occurs;the second one is that the fuse of B5 capacitorhas the defect of weak contact before closing operation and
in case of closing operation
the gap dischargesoccurs inside the fuse and therefore the B5 capacitor occurs breakdown due to the action of high frequencydischarge current.The EMTP/ATP simulation calculation is introduced so to provide new method for theanalysis of the similar fault of capacitor
accumulate experience
which has a definite engineering practicalsignificance.