LIU YONGBIN, CAO JUNZHENG, HUANG JINKUI, et al. Study Development on the Reliability of Metallized Film Capacitor. [J]. Power capacitor & reactive power compensation, 2019, 40(1): 53-58.
LIU YONGBIN, CAO JUNZHENG, HUANG JINKUI, et al. Study Development on the Reliability of Metallized Film Capacitor. [J]. Power capacitor & reactive power compensation, 2019, 40(1): 53-58. DOI: 10.14044/j.1674-1757.pcrpc.2019.01.011.
With rapid development of modern industry in China
the requirement for the performance
stability and reliability of related electrical equipment(such as capacitor)is higher.Dry type metallized film capacitor is a kind of capacitor with good safety and stability
of which the recent study is widely
particularly the operation stability study is of interest.In this paper
the study in the field of reliability of metallized film capacitor involving material aging and self-healing etc of the metalized film is summarized
such issue as self-healing mechanism and application of the metalized film
the material aging mechanism and life evaluation model ect are discussed deeply
which provides theoretical base for the optimal design on reliability of the capacitor and provides operation reference for the related engineers.
关键词
金属化膜电容器可靠性自愈老化
Keywords
metallized film capacitorreliabilityself-healingaging